Attosecond pulse generation, characterization and application: Full characterization of an attosecond pulse generated using an infrared driver

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Full characterization of an attosecond pulse generated using an infrared driver

The physics of attosecond pulse generation requires using infrared driving wavelength to reach the soft X-rays. However, with longer driving wavelength, the harmonic conversion efficiency drops significantly. It makes the conventional attosecond pulse measurement using streaking very difficult due to the low photoionization cross section in the soft X-rays region. In-situ measurement was developed for precisely this purpose. We use in-situ measurement to characterize, in both space and time, an attosecond pulse produced by ultrafast wavefront rotation of a 1.8 μm fundamental beam. We get almost constant flat wavefront curvature through the whole photon energy range. The measurement method is scalable to the soft X-ray spectral region.

Right: Reconstructed spatial-temporal profile of an isolated attosecond pulse. (a) Reconstructed XUV spectrum in the near-field where the XUV is generated. (b) The reconstructed spatial-temporal electron field of the attosecond pulse in near-field. The curves (white, green and yellow) correspond to the wavefronts for 40 eV, 50 eV and 60 eV photon energies. (c) The intensity profiles of the XUV emission in the near-field for y = 0 (blue) and y = 10.5 μm (red). (d) The intensity profiles of the XUV emission in the far-field for θ = 0 (blue) and θ = 0.8 mrad (red).

 

  1. Zhang et al, J. Phys. B: At. Mol. Opt. Phys. 48, 061001 (2015)
  2. Zhang et al, Scientific Reports 6, 26771 (2016)

Attosecond Science at uOttawa and NRC